Semi-conductor test probe SCP051 - J1U - 57 - G

Semi-conductortest probe SCP051-J1U-57 - G

Pitch 0.65mm

MechanicalSpecification

Full Stroke: 0.80mm

Rated Stroke: 0.65mm

Spring Force: 25gf@ Load 0.65mm

ElectricalSpecification

Current Rating: 1 A, Continuous

Bandwidth: 6.1GHz@-1dB

Propagation Delay:24ps

Materials

Barrel: PhosphorBronze, Gold Plated.

Plunger: Full-HardBeryllium Copper. Gold Plated.

Spring: MusicWire, Gold Plated.

Test probes works as electrical interfaces between thetest equipment and the circuit board under test. Semi-conductor probes aremainly used for testing frequency of communications devices such as mobilephones, interphones, computers, etc.

The construction of SCP051- J1U- 57- G:

The plunger is made of full-hard beryllium copper, platedwith gold to eliminate surface oxides and to lower electrical resistance

Various probe tip styles are adopted to suit any testrequirement according to different applications.

Spring is constructed of music wire, plated with goldwhich prevents corrosion.

The barrel is made of phosphor bronze, plated withgold.

HOW TO eliminate contact problems caused by dirtyprobes

Preventive Maintenance:  

Environment – reduce airborne contamination such asdust, clothing fibers or particles from an adjacent wave-solder machine 

PCB –keep printed circuit boards as clean as possible

Dust Covers – put dust covers over idle fixtures

Air Filters –fixing an air filter in the releaseport 

Probe Cleaning: 

Gently brushing the probe tips with a small brush withnylon or natural fiber bristles

Semi-conductortest probe SCP051- J1U- 57-G is included in our standard products. Apart fromit, we also provide other models of high quality and competitive price. If youare interested, please feel free to contact me or browse our website () for detailedspecifications. Thank you!

Contact person:Stella

Tel:86-755-27494785-229

Email: probe321@163.com

Skype: test123probe